8 search results - page 2 / 2 » FPGA-Based Fault Injection Techniques for Fast Evaluation of... |
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
—Time-dependent performance degradation due to transistor aging caused by mechanisms such as Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) is one o...
GLVLSI
2010
IEEE
13 years 10 months ago
2010
IEEE
NBTI is one of the most important silicon reliability problems facing processor designers today. The impact of NBTI can be mitigated at both the circuit and microarchitecture leve...
DAC
2006
ACM
13 years 8 months ago
2006
ACM
Conventionally, signal net routing is almost always implemented as Steiner trees. However, non-tree topology is often superior on timing performance as well as tolerance to open f...