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ICASSP
2007
IEEE
13 years 11 months ago
Fast Line-Based Imaging of Small Sample Features
This project aims to reduce the time required to attain more detailed scans of small interesting regions present in a quick first-pass sample image. In particular, we concentrate...
Mark A. Iwen, Gurjit S. Mandair, Michael D. Morris...
JMLR
2012
11 years 7 months ago
Domain Adaptation: A Small Sample Statistical Approach
We study the prevalent problem when a test distribution differs from the training distribution. We consider a setting where our training set consists of a small number of sample d...
Ruslan Salakhutdinov, Sham M. Kakade, Dean P. Fost...
CVPR
2008
IEEE
14 years 6 months ago
Boosting ordinal features for accurate and fast iris recognition
In this paper, we present a novel iris recognition method based on learned ordinal features.Firstly, taking full advantages of the properties of iris textures, a new iris represen...
Zhaofeng He, Zhenan Sun, Tieniu Tan, Xianchao Qiu,...
CVPR
2010
IEEE
13 years 4 months ago
Region moments: Fast invariant descriptors for detecting small image structures
This paper presents region moments, a class of appearance descriptors based on image moments applied to a pool of image features. A careful design of the moments and the image fea...
Gianfranco Doretto, Yi Yao