6 search results - page 1 / 2 » Fast and Energy-Frugal Deterministic Test Through Test Vecto... |
DFT
2002
IEEE
13 years 9 months ago
2002
IEEE
Conversion of the flip-flops of the circuit into scan cells helps ease the test challenge; yet test application time is increased as serial shift operations are employed. Furthe...
WSC
2007
13 years 6 months ago
2007
It is well known that trivariate reduction — a method to generate two dependent random variables from three independent random variables — can be used to generate Poisson rand...
DAC
2003
ACM
13 years 9 months ago
2003
ACM
We propose in this paper an extension on the Scan Chain Concealment technique to further reduce test time and volume requirement. The proposed methodology stems from the architect...
JMLR
2011
12 years 11 months ago
2011
This paper reviews a class of methods to perform causal inference in the framework of a structural vector autoregressive model. We consider three different settings. In the first ...
ICIP
2007
IEEE
14 years 6 months ago
2007
IEEE
We exploit recent advances in the physical design of fast optical systems which enable active imaging with "ballistic" light. In this modality, fast bursts of optical en...