15 search results - page 1 / 3 » Fast transient power and noise estimation for VLSI circuits |
ICCAD
1994
IEEE
13 years 8 months ago
1994
IEEE
Abstract - Today's digital design systems are running out of steam, when it comes to meeting the challenges presented by simultaneous switching, power consumption and reliabil...
VTS
2002
IEEE
13 years 9 months ago
2002
IEEE
A device testing method called Transient Signal Analysis (TSA) is subjected to elements of a real process and testing environment in this paper. Simulations experiments are design...
GLVLSI
2003
IEEE
13 years 9 months ago
2003
IEEE
With scaling down to deep submicron and nanometer technologies, noise immunity is becoming a metric of the same importance as power, speed, and area. Smaller feature sizes, low vo...
ICCAD
2001
IEEE
14 years 1 months ago
2001
IEEE
— Modern sub-micron VLSI designs include huge power grids that are required to distribute large amounts of current, at increasingly lower voltages. The resulting voltage drop on ...
EVOW
2000
Springer
13 years 8 months ago
2000
Springer
Modern VLSI design methodologies and manufacturing technologies are making circuits increasingly fast. The quest for higher circuit performance and integration density stems from f...