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LCTRTS
2010
Springer
13 years 10 months ago
2010
Springer
Continuous technology scaling has brought us to a point, where transistors have become extremely susceptible to cosmic radiation strikes, or soft errors. Inside the processor, cac...
HPCA
2006
IEEE
14 years 5 months ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...
ICDE
2007
IEEE
14 years 6 months ago
2007
IEEE
Current distributed database and stream processing systems assume that the network connecting nodes in the data processor is "always on," and that the absence of a netwo...
SENSYS
2005
ACM
13 years 11 months ago
2005
ACM
Being embedded in the physical world, sensor networks present a wide range of bugs and misbehavior qualitatively different from those in most distributed systems. Unfortunately, d...