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VLSID
2001
IEEE
164views VLSI» more  VLSID 2001»
14 years 6 months ago
An Efficient Parallel Transparent Bist Method For Multiple Embedded Memory Buffers
In this paper, we propose a new transparent built-in self-test ( TBIST ) method to test multiple embedded memory arrays with various sizes in parallel. First, a new transparent tes...
Der-Cheng Huang, Wen-Ben Jone, Sunil R. Das
FTCS
1993
87views more  FTCS 1993»
13 years 7 months ago
Disk Array Storage System Reliability
Fault tolerance requirements for near term disk array storage systems are analyzed. The excellent reliability provided by RAID Level 5 data organization is seen to be insu cient f...
Walter A. Burkhard, Jai Menon
DSN
2003
IEEE
13 years 11 months ago
On the Design of Robust Integrators for Fail-Bounded Control Systems
This paper describes the design and evaluation of a robust integrator for software-implemented control systems. The integrator is constructed as a generic component in the Simulin...
Jonny Vinter, Andréas Johansson, Peter Folk...
SMC
2007
IEEE
156views Control Systems» more  SMC 2007»
14 years 1 days ago
Dynamic fusion of classifiers for fault diagnosis
—This paper considers the problem of temporally fusing classifier outputs to improve the overall diagnostic classification accuracy in safety-critical systems. Here, we discuss d...
Satnam Singh, Kihoon Choi, Anuradha Kodali, Krishn...
SPAA
2003
ACM
13 years 11 months ago
The effect of communication costs in solid-state quantum computing architectures
Quantum computation has become an intriguing technology with which to attack difficult problems and to enhance system security. Quantum algorithms, however, have been analyzed un...
Dean Copsey, Mark Oskin, Tzvetan S. Metodi, Freder...