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ICCAD
2008
IEEE
138views Hardware» more  ICCAD 2008»
12 years 5 months ago
Fault tolerant placement and defect reconfiguration for nano-FPGAs
—When manufacturing nano-devices, defects are a certainty and reliability becomes a critical issue. Until now, the most pervasive methods used to address reliability, involve inj...
Amit Agarwal, Jason Cong, Brian Tagiku
ARCS
2008
Springer
11 years 10 months ago
Topology-Aware Replica Placement in Fault-Tolerant Embedded Networks
Application details uncertain at design time as well as tolerance against permanent resource defects demand flexibility and redundancy. In this context, we present a strategy for p...
Thilo Streichert, Michael Glaß, Rolf Wanka, ...
FPL
2006
Springer
99views Hardware» more  FPL 2006»
11 years 11 months ago
Reconfiguration and Fine-Grained Redundancy for Fault Tolerance in FPGAs
As manufacturing technology enters the ultra-deep submicron era, wafer yields are destined to drop due to higher occurrence of physical defects on the die. This paper proposes a y...
Nicola Campregher, Peter Y. K. Cheung, George A. C...
TC
1998
11 years 7 months ago
Methodologies for Tolerating Cell and Interconnect Faults in FPGAs
—The very high levels of integration and submicron device sizes used in current and emerging VLSI technologies for FPGAs lead to higher occurrences of defects and operational fau...
Fran Hanchek, Shantanu Dutt
ISVLSI
2006
IEEE
149views VLSI» more  ISVLSI 2006»
12 years 2 months ago
Defect-Aware Design Paradigm for Reconfigurable Architectures
With advances in process technology, the feature sizes are decreasing, which leads to higher defect densities. More sophisticated techniques, at increased costs are required to av...
Rahul Jain, Anindita Mukherjee, Kolin Paul
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