16 search results - page 2 / 4 » Fault tolerant placement and defect reconfiguration for nano... |
SIES
2010
IEEE
13 years 2 months ago
2010
IEEE
In this paper we present an approach to increase the fault tolerance in FlexRay networks by introducing backup nodes to replace defect ECUs (Electronic Control Units). In order to ...
ICCAD
2005
IEEE
14 years 1 months ago
2005
IEEE
— Yield improvement through exploiting fault-free sections of defective chips is a well-known technique [1][2]. The idea is to partition the circuitry of a chip in a way that fau...
DAC
2004
ACM
14 years 5 months ago
2004
ACM
Recent successes in the development and self-assembly of nanoelectronic devices suggest that the ability to manufacture dense nanofabrics is on the near horizon. However, the trem...
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
Technology Roadmap for Semiconductors (ITRS) clearly identifies the integration of electrochemical and electrobiological techniques as one of the system-level design challenges tha...
IOLTS
2007
IEEE
13 years 10 months ago
2007
IEEE
i To boost logic density and reduce per unit power consumption SRAM-based FPGAs manufacturers adopted nanometric technologies. However, this technology is highly vulnerable to radi...