72 search results - page 15 / 15 » Fault-Based Test Case Generation for Component Connectors |
CEC
2010
IEEE
13 years 6 months ago
2010
IEEE
Inspired originally by the Learnable Evolution Model(LEM) [5], we investigate LEM(ID3), a hybrid of evolutionary search with ID3 decision tree learning. LEM(ID3) involves interleav...
PLDI
2011
ACM
12 years 7 months ago
2011
ACM
Fixing software bugs has always been an important and timeconsuming process in software development. Fixing concurrency bugs has become especially critical in the multicore era. H...