15 search results - page 2 / 3 » Fault-Simulation Based Design Error Diagnosis for Sequential... |
ET
2007
13 years 5 months ago
2007
This article describes an emulation-based method for locating stuck-at faults in combinational and synchronous sequential circuits. The method is based on automatically designing a...
VTS
1999
IEEE
13 years 10 months ago
1999
IEEE
This paper describes an approach to design error diagnosis and correction in combinational digital circuits. Our approach targets small errors introduced during the design process...
ICCAD
2006
IEEE
14 years 2 months ago
2006
IEEE
Soft error tolerant design becomes more crucial due to exponential increase in the vulnerability of computer systems to soft errors. Accurate estimation of soft error rate (SER), ...
GLVLSI
2008
IEEE
13 years 6 months ago
2008
IEEE
Due to the increasing complexity of today's circuits a high degree of automation in the design process is mandatory. The detection of faults and design errors is supported qu...
ICCAD
2009
IEEE
13 years 3 months ago
2009
IEEE
With increasing process variation, binning has become an important technique to improve the values of fabricated chips, especially in high performance microprocessors where transpa...