11 search results - page 1 / 3 » Faults Coverage Improvement Based on Fault Simulation and Pa... |
DSD
2010
IEEE
13 years 3 months ago
2010
IEEE
— A method how to improve the coverage of single faults in combinational circuits is proposed. The method is based on Concurrent Error Detection, but uses a fault simulation to f...
DSN
2008
IEEE
13 years 11 months ago
2008
IEEE
In the near future, hardware is expected to become increasingly vulnerable to faults due to continuously decreasing feature size. Software-level symptoms have previously been used...
ETS
2009
IEEE
13 years 2 months ago
2009
IEEE
Structural on-line self-test may be performed to detect permanent faults and avoid their accumulation. This paper improves concurrent BIST techniques based on a deterministic test ...
ICCAD
1995
IEEE
13 years 8 months ago
1995
IEEE
: We present several techniques for accelerating dynamic vector compaction for combinational and sequential circuits. A key feature of all our techniques is that they significantly...
ITC
2003
IEEE
13 years 9 months ago
2003
IEEE
In this paper, we study the possibility of using logic defect-level prediction models to predict the detection behavior of statistical timing defects. We compare two known logic m...