11 search results - page 2 / 3 » Faults Coverage Improvement Based on Fault Simulation and Pa... |
ISCAS
2003
IEEE
13 years 9 months ago
2003
IEEE
Improving testability during the early stages of High-Level Synthesis (HLS) has several benefits, including reduced test hardware overhead, reduced test costs, reduced design iter...
ET
2000
13 years 4 months ago
2000
The paper presents a novel hierarchical approach to test pattern generation for sequential circuits based on an input model of mixed-level decision diagrams. A method that handles,...
DAC
1999
ACM
13 years 8 months ago
1999
ACM
Dynamic-current based test techniques can potentially address the drawbacks of traditional and Iddq test methodologies. The quality of dynamic current based test is degraded by pr...
CCGRID
2010
IEEE
13 years 5 months ago
2010
IEEE
Although shared memory programming models show good programmability compared to message passing programming models, their implementation by page-based software distributed shared m...
DSN
2009
IEEE
13 years 11 months ago
2009
IEEE
The threat of soft error induced system failure in high performance computing systems has become more prominent, as we adopt ultra-deep submicron process technologies. In this pap...