168 search results - page 3 / 34 » Feature selection focused within error clusters |
AVI
2006
13 years 6 months ago
2006
Scientific measurements are often depicted as line graphs. Stateof-the-art high throughput systems in life sciences, telemetry and electronics measurement rapidly generate hundred...
ICASSP
2011
IEEE
12 years 9 months ago
2011
IEEE
The Dirichlet Process Mixture (DPM) models represent an attractive approach to modeling latent distributions parametrically. In DPM models the Dirichlet process (DP) is applied es...
CIVR
2005
Springer
13 years 11 months ago
2005
Springer
We analyze the special structure of the relevance feedback learning problem, focusing particularly on the effects of image selection by partial relevance on the clustering behavio...
CVPR
2009
IEEE
15 years 14 days ago
2009
IEEE
Feature selection plays a fundamental role in many pattern
recognition problems. However, most efforts have been
focused on the supervised scenario, while unsupervised feature
s...
ECCV
2008
Springer
14 years 7 months ago
2008
Springer
Abstract. We address the problem of estimating human body pose from a single image with cluttered background. We train multiple local linear regressors for estimating the 3D pose f...