In this paper we describe a method for detection and measurement of elliptical particles in atomic force microscopy (AFM) images. AFM imaging is used in physics to scan surfaces; ...
This paper introduces the sparse multilayer perceptron (SMLP) which learns the transformation from the inputs to the targets as in multilayer perceptron (MLP) while the outputs of...
The class imbalance is a critical problem in classification tasks related to many real world applications. A large number of solutions were proposed in literature, both at the al...
Maria Teresa Ricamato, Claudio Marrocco, Francesco...
We study the information-theoretic limits of exactly recovering the support set of a sparse signal, using noisy projections defined by various classes of measurement matrices. Our ...
Wei Wang, Martin J. Wainwright, Kannan Ramchandran
This paper considers the image reconstruction problem when the original image is assumed to be sparse and when limited information of the point spread function (PSF) is available....