8 search results - page 2 / 2 » Full Sensitivity and Test Generation for Multiple-Valued Log... |
ETS
2006
IEEE
14 years 4 days ago
2006
IEEE
A central problem in built-in self test (BIST) is how to efficiently generate a small set of test vectors that detect all targeted faults. We propose a novel solution that uses l...
DATE
2000
IEEE
13 years 10 months ago
2000
IEEE
The Boolean satisfiability problem (SAT) has various applications in electronic design automation (EDA) fields such as testing, timing analysis and logic verification. SAT has bee...
AMOST
2007
ACM
13 years 10 months ago
2007
ACM
Model-checkers have recently been suggested for automated software test-case generation. Several works have presented methods that create efficient test-suites using model-checker...