6 search results - page 1 / 2 » Full-chip analysis of leakage power under process variations... |
DAC
2005
ACM
14 years 5 months ago
2005
ACM
In this paper, we present a method for analyzing the leakage current, and hence the leakage power, of a circuit under process parameter variations that can include spatial correla...
DAC
2007
ACM
14 years 5 months ago
2007
ACM
We present an efficient technique for finding the mean and variance of the full-chip leakage of a candidate design, while considering logic-structures and both die-to-die and with...
ICCD
2006
IEEE
14 years 1 months ago
2006
IEEE
— As the technology scales into 90nm and below, process-induced variations become more pronounced. In this paper, we propose an efficient stochastic method for analyzing the vol...
ICCAD
2003
IEEE
13 years 9 months ago
2003
IEEE
The impact of power supply integrity on a design has become a critical issue, not only for functional verification, but also for performance verification. Traditional analysis has...
BMCBI
2006
13 years 4 months ago
2006
Background: High-density microarray technology is increasingly applied to study gene expression levels on a large scale. Microarray experiments rely on several critical steps that...