194 search results - page 1 / 39 » Functional Test Generation Based on Combined Random and Dete... |
INFORMATICALT
2007
13 years 4 months ago
2007
Abstract. The aim of this paper is to explore some features of the functional test generation problem, and on the basis of the gained experience, to propose a practical method for ...
VLSID
1993
IEEE
13 years 8 months ago
1993
IEEE
This paper discusses a Genetic Algorithm-based method of generating test vectorsfor detecting faults in combinational circuits. The GA-based approach combines the merits of two te...
ET
2000
13 years 4 months ago
2000
The paper presents a novel hierarchical approach to test pattern generation for sequential circuits based on an input model of mixed-level decision diagrams. A method that handles,...
CVPR
2009
IEEE
14 years 2 months ago
2009
IEEE
Many vision problems have been formulated as en- ergy minimization problems and there have been signif- icant advances in energy minimization algorithms. The most widely-used energ...
DSD
2007
IEEE
13 years 11 months ago
2007
IEEE
This paper discusses possibilities for a choice of a pseudorandom pattern generator that is to be used in combination with the column-matching based built-in self-test design meth...