123 search results - page 1 / 25 » Functional Test Generation for FSMs by Fault Extraction |
DAC
1994
ACM
13 years 8 months ago
1994
ACM
Recent results indicate that functional test pattern generation (TPG) techniques may provide better defect coverages than do traditional logic-level techniques. Functional TPG alg...
EVOW
2008
Springer
13 years 6 months ago
2008
Springer
Traditional test generation methodologies for peripheral cores are performed by a skilled test engineer, leading to long generation times. In this paper a test generation methodolo...
DSD
2006
IEEE
13 years 10 months ago
2006
IEEE
Recently, a number of works have been published on implementing assignment decision diagram models combined with SAT methods to address register-transfer level test pattern genera...
COMPSAC
1996
IEEE
13 years 8 months ago
1996
IEEE
This paper discusses how conventional testing criteria such as branch coverage can be applied for the testing of member functions inside a class. To support such testing technique...
ICDCS
1993
IEEE
13 years 8 months ago
1993
IEEE
In this paper, we propose a diagnostic algorithm for the case where distributed system specifications (implementations) are given in the form of communicating finite state machine...