3 search results - page 1 / 1 » Functional constraints vs. test compression in scan-based de... |
DATE
2006
IEEE
13 years 10 months ago
2006
IEEE
We present an approach to prevent overtesting in scan-based delay test. The test data is transformed with respect to functional constraints while simultaneously keeping as many po...
ISQED
2003
IEEE
13 years 9 months ago
2003
IEEE
A structurally testable delay fault might become untestable in the functional mode of the circuit due to logic or timing constraints or both. Experimental data suggests that there...
TIT
2008
13 years 4 months ago
2008
Abstract-- Distributed detection of information flows by timing analysis is considered. Timing measurements are subject to perturbations and the insertion of chaff noise. Moreover,...