32 search results - page 7 / 7 » Gate Level Statistical Simulation Based on Parameterized Mod... |
EPIA
2003
Springer
13 years 10 months ago
2003
Springer
Most of supervised learning algorithms assume the stability of the target concept over time. Nevertheless in many real-user modeling systems, where the data is collected over an ex...
MICRO
2006
IEEE
13 years 5 months ago
2006
IEEE
Shrinking devices to the nanoscale, increasing integration densities, and reducing of voltage levels down to the thermal limit, all conspire to produce faulty systems. Frequent oc...