Sciweavers

5 search results - page 1 / 1
» Gate replacement techniques for simultaneous leakage and agi...
Sort
View
DATE
2009
IEEE
135views Hardware» more  DATE 2009»
13 years 10 months ago
Gate replacement techniques for simultaneous leakage and aging optimization
—1As technology scales, the aging effect caused by Negative Bias Temperature Instability (NBTI) has become a major reliability concern for circuit designers. On the other hand, r...
Yu Wang 0002, Xiaoming Chen, Wenping Wang, Yu Cao,...
DAC
2005
ACM
14 years 4 months ago
Enhanced leakage reduction Technique by gate replacement
Input vector control (IVC) technique utilizes the stack effect in CMOS circuit to apply the minimum leakage vector (MLV) to the circuit at the sleep mode to reduce leakage. Additi...
Lin Yuan, Gang Qu
PATMOS
2007
Springer
13 years 9 months ago
Soft Error-Aware Power Optimization Using Gate Sizing
—Power consumption has emerged as the premier and most constraining aspect in modern microprocessor and application-specific designs. Gate sizing has been shown to be one of the...
Foad Dabiri, Ani Nahapetian, Miodrag Potkonjak, Ma...
ICCAD
2006
IEEE
103views Hardware» more  ICCAD 2006»
14 years 15 days ago
A statistical framework for post-silicon tuning through body bias clustering
Adaptive body biasing (ABB) is a powerful technique that allows post-silicon tuning of individual manufactured dies such that each die optimally meets the delay and power constrai...
Sarvesh H. Kulkarni, Dennis Sylvester, David Blaau...
ICCD
2008
IEEE
165views Hardware» more  ICCD 2008»
14 years 17 days ago
Analysis and minimization of practical energy in 45nm subthreshold logic circuits
Abstract— Over the last decade, the design of ultra-lowpower digital circuits in subthreshold regime has been driven by the quest for minimum energy per operation. In this contri...
David Bol, Renaud Ambroise, Denis Flandre, Jean-Di...