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ICST
2009
IEEE
13 years 11 months ago
Generating Feasible Transition Paths for Testing from an Extended Finite State Machine (EFSM)
The problem of testing from an extended finite state machine (EFSM) can be expressed in terms of finding suitable paths through the EFSM and then deriving test data to follow the ...
Abdul Salam Kalaji, Robert M. Hierons, Stephen Swi...
COMPSAC
2002
IEEE
13 years 9 months ago
Expanding an Extended Finite State Machine to aid Testability
The problem of testing from an extended finite state machine (EFSM) is complicated by the presence of infeasible paths. This paper considers the problem of expanding an EFSM in o...
Robert M. Hierons, T.-H. Kim, Hasan Ural
ICSEA
2007
IEEE
13 years 10 months ago
A Novel Framework for Test Domain Reduction using Extended Finite State Machine
Test case generation is an expensive, tedious, and errorprone process in software testing. In this paper, test case generation is accomplished using an Extended Finite State Machi...
Nutchakorn Ngamsaowaros, Peraphon Sophatsathit
DATE
2009
IEEE
178views Hardware» more  DATE 2009»
13 years 11 months ago
Correct-by-construction generation of device drivers based on RTL testbenches
Abstract—The generation of device drivers is a very time consuming and error prone activity. All the strategies proposed up to now to simplify this operation require a manual, ev...
Nicola Bombieri, Franco Fummi, Graziano Pravadelli...
CN
2004
89views more  CN 2004»
13 years 4 months ago
On the testability of SDL specifications
The problem of testing from an SDL specification is often complicated by the presence of infeasible paths. This paper introduces an approach for transforming a class of SDL specif...
Robert M. Hierons, T.-H. Kim, Hasan Ural