22 search results - page 1 / 5 » Generation of Test Patterns for Differential Diagnosis of Di... |
CP
1998
Springer
13 years 9 months ago
1998
Springer
In a faulty digital circuit, many (single) faulty gates may explain the observed findings. In this paper we are mostly concerned, not in obtaining alternative diagnoses, but rathe...
SAC
1997
ACM
13 years 8 months ago
1997
ACM
ICTAI
1994
IEEE
13 years 8 months ago
1994
IEEE
CORR
2011
Springer
12 years 11 months ago
2011
Springer
This paper investigates the impact of the changes of the characteristic polynomials and initial loadings, on behaviour of aliasing errors of parallel signature analyzer (Multi-Inp...
DELTA
2008
IEEE
13 years 11 months ago
2008
IEEE
Scan is a widely used design-for-testability technique to improve test and diagnosis quality, however, scan chain failures account for almost 50% of chip failures. In this paper, ...