22 search results - page 5 / 5 » Generation of Test Patterns for Differential Diagnosis of Di... |
DAC
2002
ACM
14 years 6 months ago
2002
ACM
At-speed testing of high-speed circuits is becoming increasingly difficult with external testers due to the growing gap between design and tester performance, growing cost of high...
ISBI
2006
IEEE
14 years 6 months ago
2006
IEEE
We introduce a method for estimating regional connectivity in diffusion tensor magnetic resonance imaging (DT-MRI) based on a fluid mechanics model. We customize the Navier-Stokes...