6 search results - page 1 / 2 » Hierarchical statistical characterization of mixed-signal ci... |
ICCAD
1996
IEEE
13 years 9 months ago
1996
IEEE
A methodology for hierarchicalstatistical circuit characterization which does not rely upon circuit-level Monte Carlo simulation is presented. The methodology uses principalcompon...
ENTCS
2006
13 years 4 months ago
2006
The application of formal methods to analog and mixed signal circuits requires efficient methods tructing abstractions of circuit behaviors. This paper concerns the verification o...
ICCAD
2006
IEEE
14 years 1 months ago
2006
IEEE
An approach to robust system level mixed signal design is presented based on analog platforms. The bottom-up characterization phase of platform components provides accurate perfor...
ICCD
2007
IEEE
13 years 11 months ago
2007
IEEE
A methodology for constructing circuit-level mismatch models and performing yield optimization is presented for CMOS analog circuits. The methodology combines statistical techniqu...
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
—Variations of process parameters have an important impact on reliability and yield in deep sub micron IC technologies. One methodology to estimate the influence of these effects...