Sciweavers

Share
8 search results - page 1 / 2
» High Quality ATPG for Delay Defects
Sort
View
ITC
2003
IEEE
120views Hardware» more  ITC 2003»
9 years 6 months ago
High Quality ATPG for Delay Defects
: The paper presents a novel technique for generating effective vectors for delay defects. The test set achieves high path delay fault coverage to capture smalldistributed delay de...
Puneet Gupta, Michael S. Hsiao
VTS
2008
IEEE
136views Hardware» more  VTS 2008»
9 years 7 months ago
Test-Pattern Grading and Pattern Selection for Small-Delay Defects
Timing-related defects are becoming increasingly important in nanometer technology designs. Small delay variations induced by crosstalk, process variations, powersupply noise, as ...
Mahmut Yilmaz, Krishnendu Chakrabarty, Mohammad Te...
ASPDAC
2004
ACM
102views Hardware» more  ASPDAC 2004»
9 years 6 months ago
TranGen: a SAT-based ATPG for path-oriented transition faults
— This paper presents a SAT-based ATPG tool targeting on a path-oriented transition fault model. Under this fault model, a transition fault is detected through the longest sensit...
Kai Yang, Kwang-Ting Cheng, Li-C. Wang
ATS
2010
IEEE
229views Hardware» more  ATS 2010»
8 years 11 months ago
Variation-Aware Fault Modeling
Abstract--To achieve a high product quality for nano-scale systems both realistic defect mechanisms and process variations must be taken into account. While existing approaches for...
Fabian Hopsch, Bernd Becker, Sybille Hellebrand, I...
TCAD
2008
114views more  TCAD 2008»
9 years 1 months ago
Test-Quality/Cost Optimization Using Output-Deviation-Based Reordering of Test Patterns
At-speed functional testing, delay testing, and n-detection test sets are being used today to detect deep submicrometer defects. However, the resulting test data volumes are too hi...
Zhanglei Wang, Krishnendu Chakrabarty
books