8 search results - page 2 / 2 » High Quality ATPG for Delay Defects |
ISPW
2007
IEEE
13 years 10 months ago
2007
IEEE
The possible variability of project delay is useful information to understand and mitigate the project delay risk. However, it is not sufficiently considered in the literature con...
ET
2002
13 years 4 months ago
2002
The combination of higher quality requirements and sensitivity of high performance circuits to delay defects has led to an increasing emphasis on delay testing of VLSI circuits. A...
IOLTS
2000
IEEE
13 years 9 months ago
2000
IEEE
The combination of higher quality requirements and sensitivity of high performance circuits to delay defects has led to an increasing emphasis on delay testing of VLSI circuits. A...