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VTS
2002
IEEE
106views Hardware» more  VTS 2002»
13 years 9 months ago
How Effective are Compression Codes for Reducing Test Data Volume?
Run-length codes and their variants have recently been shown to be very effective for compressing system-on-achip (SOC) test data. In this paper, we analyze the Golomb code, the c...
Anshuman Chandra, Krishnendu Chakrabarty, Rafael A...
ICCD
2003
IEEE
130views Hardware» more  ICCD 2003»
14 years 1 months ago
On Combining Pinpoint Test Set Relaxation and Run-Length Codes for Reducing Test Data Volume
This paper presents a pinpoint test set relaxation method for test compression that maximally derives the capability of a run-length encoding technique such as Golomb coding or fr...
Seiji Kajihara, Yasumi Doi, Lei Li, Krishnendu Cha...
DATE
2002
IEEE
103views Hardware» more  DATE 2002»
13 years 9 months ago
Test Resource Partitioning and Reduced Pin-Count Testing Based on Test Data Compression
We present a new test resource partitioning (TRP) technique for reduced pin-count testing of system-on-a-chip (SOC). The proposed technique is based on test data compression and o...
Anshuman Chandra, Krishnendu Chakrabarty
ICCD
2003
IEEE
145views Hardware» more  ICCD 2003»
14 years 1 months ago
Care Bit Density and Test Cube Clusters: Multi-Level Compression Opportunities
: Most of the recently discussed and commercially introduced test stimulus data compression techniques are based on low care bit densities found in typical scan test vectors. Data ...
Bernd Könemann
ASPDAC
2007
ACM
108views Hardware» more  ASPDAC 2007»
13 years 8 months ago
RunBasedReordering: A Novel Approach for Test Data Compression and Scan Power
As the large size of test data volume is becoming one of the major problems in testing System-on-a-Chip (SoC), several compression coding schemes have been proposed. Extended frequ...
Hao Fang, Chenguang Tong, Xu Cheng