3 search results - page 1 / 1 » Impact of NBTI on SRAM Read Stability and Design for Reliabi... |
ISQED
2006
IEEE
13 years 10 months ago
2006
IEEE
— Negative Bias Temperature Instability (NBTI) has the potential to become one of the main show-stoppers of circuit reliability in nanometer scale devices due to its deleterious ...
ISQED
2010
IEEE
13 years 11 months ago
2010
IEEE
—Negative Bias Temperature Instability (NBTI) is one of the major reliability problems in advanced technologies. NBTI causes threshold voltage degradation in a PMOS transistor wh...
JCP
2008
13 years 4 months ago
2008
Semiconductor manufacturing process scaling increases leakage and transistor variations, both of which are problematic for static random access memory (SRAM). Since SRAM is a criti...