5 search results - page 1 / 1 » Impact of Process Variations on Carbon Nanotube Bundle Inter... |
ISVLSI
2007
IEEE
13 years 10 months ago
2007
IEEE
As CMOS technology continues to scale, copper interconnect (CuI) will hinder the performance and reliability of Field Programmable Gate Arrays (FPGA) motivating the need for alter...
DATE
2007
IEEE
13 years 11 months ago
2007
IEEE
Field Programmable Gate Arrays (FPGAs) are important hardware platforms in various applications due to increasing design complexity and mask costs. However, as CMOS process techno...
ISQED
2007
IEEE
13 years 10 months ago
2007
IEEE
SLIP
2009
ACM
13 years 11 months ago
2009
ACM
In this paper, a comprehensive and fast method is presented for the timing analysis of process variations on single-walled carbon nanotube (SWCNT) bundles. Unlike previous works t...
DATE
2010
IEEE
13 years 9 months ago
2010
IEEE
—Static and dynamic variations, which have negative impact on the reliability of microelectronic systems, increase with smaller CMOS technology. Thus, further downscaling is only...