15 search results - page 1 / 3 » Impact of Technology and Voltage Scaling on the Soft Error S... |
DFT
2008
IEEE
13 years 11 months ago
2008
IEEE
With each technology node shrink, a silicon chip becomes more susceptible to soft errors. The susceptibility further increases as the voltage is scaled down to save energy. Based ...
ICCD
2008
IEEE
14 years 1 months ago
2008
IEEE
—Nanoscale integrated circuits are becoming increasingly sensitive to radiation-induced transient faults (soft errors) due to current technology scaling trends, such as shrinking...
ISQED
2007
IEEE
13 years 10 months ago
2007
IEEE
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we use...
DSD
2007
IEEE
13 years 8 months ago
2007
IEEE
In this study, we investigate different cache fault tolerance techniques to determine which will be most effective when on-chip memory cell defect probabilities exceed those of cu...
ISVLSI
2006
IEEE
13 years 10 months ago
2006
IEEE
FinFET technology has been proposed as a promising alternative for deep sub-micro bulk CMOS technology, because of its better scalability. Previous work have studied the performan...