29 search results - page 2 / 6 » Improved Fault Emulation for Synchronous Sequential Circuits |
DAC
1992
ACM
13 years 9 months ago
1992
ACM
DAC
1992
ACM
13 years 9 months ago
1992
ACM
ICCAD
1998
IEEE
13 years 9 months ago
1998
IEEE
In this paper, we present results for significantly improving the performance of sequential circuit diagnostic test pattern generation (DATPG). Our improvements are achieved by de...
ICCAD
1999
IEEE
13 years 9 months ago
1999
IEEE
We describe a method referred to as sequence counting to improve on the levels of compaction achievable by vector omission based static compaction procedures. Such procedures are ...
DAC
1994
ACM
13 years 9 months ago
1994
ACM
A low overhead DFT technique, called clock-grouping, for delay testing of sequential synchronous circuits is presented. The proposed technique increases robust path delay fault co...