8 search results - page 1 / 2 » Incremental Diagnosis of Multiple Open-Interconnects |
ITC
2002
IEEE
13 years 9 months ago
2002
IEEE
With increasing chip interconnect distances, openinterconnect is becoming an important defect. The main challenge with open-interconnects stems from its non-deterministic real-lif...
IM
2003
13 years 5 months ago
2003
Abstract: A probabilistic event-driven fault localization technique is presented, which uses a symptom-fault map as a fault propagation model. The technique isolates the most proba...
CN
2004
13 years 4 months ago
2004
This paper presents a probabilistic event-driven fault localization technique, which uses a probabilistic symptomfault map as a fault propagation model. The technique isolates the...
VTS
1999
IEEE
13 years 8 months ago
1999
IEEE
This paper describes an approach to design error diagnosis and correction in combinational digital circuits. Our approach targets small errors introduced during the design process...
DATE
2002
IEEE
13 years 9 months ago
2002
IEEE
An incremental simulation-based approach to fault diagnosis and logic debugging is presented. During each iteration of the algorithm, a single suspicious location is identified a...