2 search results - page 1 / 1 » Industrial evaluation of DRAM SIMM tests |
ITC
2000
IEEE
13 years 9 months ago
2000
IEEE
This paper describes the results of testing 50 single inline memory modules (SIMMs), each containing 16 16Mbit DRAM chips (DUTs); 39 SIMMs failed, and of the 800 DUTs, 116failed. ...
DDECS
2007
IEEE
13 years 11 months ago
2007
IEEE
Abstract: High speed DRAMs today suffer from an increased sensitivity to interference and noise problems. Signal integrity issues, caused by bit line and word line coupling, result...