481 search results - page 1 / 97 » Interactive Simulation of Burning Objects |
PG
2003
IEEE
13 years 10 months ago
2003
IEEE
In this paper we describe a fast and interactive method for simulating and controlling the combustion process together with the decomposition of burning solids. The combustion and...
SMA
2005
ACM
13 years 10 months ago
2005
ACM
For simulations involving complex objects, a number of different properties must be represented. An example of this is in modeling an object undergoing combustion—heat amounts,...
DATE
2008
IEEE
13 years 11 months ago
2008
IEEE
Abstract—Wafer-level test during burn-in (WLTBI) has recently emerged as a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, the testi...
VTS
2008
IEEE
13 years 11 months ago
2008
IEEE
—Wafer-level test during burn-in (WLTBI) is a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, scan-based testing leads to significa...
TVCG
2010
13 years 3 months ago
2010
— This paper presents topology-based methods to robustly extract, analyze, and track features defined as subsets of isosurfaces. First, we demonstrate how features identified b...