26 search results - page 5 / 6 » Isolating failure causes through test case generation |
SENSYS
2010
ACM
13 years 3 months ago
2010
ACM
Wireless sensor networks (WSNs) are hard to program due to unconventional programming models used to satisfy stringent resource constraints. The common event-driven concurrent pro...
KBSE
2007
IEEE
13 years 11 months ago
2007
IEEE
Programs written in languages that provide direct access to memory through pointers often contain memory-related faults, which may cause non-deterministic failures and even securi...
MICRO
2006
IEEE
13 years 11 months ago
2006
IEEE
Design variability due to die-to-die and within-die process variations has the potential to significantly reduce the maximum operating frequency and the effective yield of high-p...
APN
2010
Springer
13 years 10 months ago
2010
Springer
Service-oriented computing proposes services as building blocks which can be composed to complex systems. To reason about the correctness of a service, its communication protocol n...
DAC
2010
ACM
13 years 9 months ago
2010
ACM
As the geometry shrinking faces severe limitations, 3D wafer stacking with through silicon via (TSV) has gained interest for future SOC integration. Since TSV fill material and s...