33 search results - page 1 / 7 » Leveraging 3D Technology for Improved Reliability |
MICRO
2007
IEEE
13 years 10 months ago
2007
IEEE
Aggressive technology scaling over the years has helped improve processor performance but has caused a reduction in processor reliability. Shrinking transistor sizes and lower sup...
SC
2009
ACM
13 years 11 months ago
2009
ACM
The scalability of future massively parallel processing (MPP) systems is being severely challenged by high failure rates. Current hard disk drive (HDD) checkpointing results in ov...
ICPP
2008
IEEE
13 years 11 months ago
2008
IEEE
A rising horizon in chip fabrication is the 3D integration technology. It stacks two or more dies vertically with a dense, high-speed interface to increase the device density and ...
MICRO
2008
IEEE
13 years 11 months ago
2008
IEEE
— As semiconductor processing techniques continue to scale down, transient faults, also known as soft errors, are increasingly becoming a reliability threat to high-performance m...
TPDS
2010
13 years 2 months ago
2010
Abstract—A rising horizon in chip fabrication is the 3D integration technology. It stacks two or more dies vertically with a dense, highspeed interface to increase the device den...