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» Linear analysis of random process variability
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GLOBECOM
2010
IEEE
13 years 4 months ago
Automatic Gain Control for ADC-Limited Communication
As the date rates and bandwidths of communication systems scale up, the cost and power consumption of highprecision (e.g., 8-12 bits) analog-to-digital converters (ADCs) become pro...
Feifei Sun, Jaspreet Singh, Upamanyu Madhow
VTC
2010
IEEE
167views Communications» more  VTC 2010»
13 years 3 months ago
The Impact of Fading on the Outage Probability in Cognitive Radio Networks
Abstract--This paper analyzes the outage probability in cognitive radio networks, based on the Poisson point process model of node spatial distribution and the standard propagation...
Yaobin Wen, Sergey Loyka, Abbas Yongaçoglu
SIGMOD
2010
ACM
223views Database» more  SIGMOD 2010»
13 years 10 months ago
Finding maximal cliques in massive networks by H*-graph
Maximal clique enumeration (MCE) is a fundamental problem in graph theory and has important applications in many areas such as social network analysis and bioinformatics. The prob...
James Cheng, Yiping Ke, Ada Wai-Chee Fu, Jeffrey X...
VISUALIZATION
2005
IEEE
13 years 11 months ago
Evolutionary Morphing
We introduce a technique to visualize the gradual evolutionary change of the shapes of living things as a morph between known three-dimensional shapes. Given geometric computer mo...
David F. Wiley, Nina Amenta, Dan A. Alcantara, Deb...
DAC
2008
ACM
14 years 7 months ago
Statistical modeling and simulation of threshold variation under dopant fluctuations and line-edge roughness
The threshold voltage (Vth) of a nanoscale transistor is severely affected by random dopant fluctuations and line-edge roughness. The analysis of these effects usually requires at...
Yun Ye, Frank Liu, Sani R. Nassif, Yu Cao