654 search results - page 1 / 131 » Linearity Testing in Characteristic Two |
FOCS
1995
IEEE
13 years 8 months ago
1995
IEEE
ISSAC
2009
Springer
13 years 11 months ago
2009
Springer
We address complexity issues for linear differential equations in characteristic p > 0: resolution and computation of the p-curvature. For these tasks, our main focus is on al...
ISSRE
2006
IEEE
13 years 11 months ago
2006
IEEE
The widespread deployment of graphical-user interfaces (GUIs) has increased the overall complexity of testing. A GUI test designer needs to perform the daunting task of adequately...
DGCI
2009
Springer
13 years 8 months ago
2009
Springer
The Minimum Length Polygon (MLP) is an interesting first order approximation of a digital contour. For instance, the convexity of the MLP is characteristic of the digital convexit...
ICIP
2003
IEEE
14 years 6 months ago
2003
IEEE
A critical step in defect detection for semiconductorprocess is to align a test image against a reference. This includes both spatial alignment and grayscale alignment. For the la...