We address complexity issues for linear differential equations in characteristic p > 0: resolution and computation of the p-curvature. For these tasks, our main focus is on al...
The widespread deployment of graphical-user interfaces (GUIs) has increased the overall complexity of testing. A GUI test designer needs to perform the daunting task of adequately...
The Minimum Length Polygon (MLP) is an interesting first order approximation of a digital contour. For instance, the convexity of the MLP is characteristic of the digital convexit...
A critical step in defect detection for semiconductorprocess is to align a test image against a reference. This includes both spatial alignment and grayscale alignment. For the la...