2 search results - page 1 / 1 » Low Cost Built in Self Test for Public Key Crypto Cores |
FDTC
2010
Springer
13 years 2 months ago
2010
Springer
The testability of the cryptographic cores brings in an extra dimension to the process of digital circuits testing
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...