Sciweavers

Share
3 search results - page 1 / 1
» Low Transition LFSR for BIST-Based Applications
Sort
View
ICCD
2002
IEEE
108views Hardware» more  ICCD 2002»
10 years 2 months ago
Low Power Mixed-Mode BIST Based on Mask Pattern Generation Using Dual LFSR Re-Seeding
Low power design techniques have been employed for more than two decades, however an emerging problem is satisfying the test power constraints for avoiding destructive test and im...
Paul M. Rosinger, Bashir M. Al-Hashimi, Nicola Nic...
TCAD
2002
134views more  TCAD 2002»
9 years 5 months ago
DS-LFSR: a BIST TPG for low switching activity
A test pattern generator (TPG) for built-in self-test (BIST), which can reduce switching activity during test application, is proposed. The proposed TPG, called dual-speed LFSR (DS...
Seongmoon Wang, Sandeep K. Gupta
ATS
2005
IEEE
191views Hardware» more  ATS 2005»
9 years 11 months ago
Low Transition LFSR for BIST-Based Applications
Abstract—This paper presents a low transition test pattern generator, called LT-LFSR, to reduce average and peak power of a circuit during test by reducing the transitions within...
Mohammad Tehranipoor, Mehrdad Nourani, Nisar Ahmed
books