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DSN
2008
IEEE
13 years 6 months ago
An accurate flip-flop selection technique for reducing logic SER
The combination of continued technology scaling and increased on-chip transistor densities has made vulnerability to radiation induced soft errors a significant design concern. In...
Eric L. Hill, Mikko H. Lipasti, Kewal K. Saluja
MICRO
2009
IEEE
178views Hardware» more  MICRO 2009»
13 years 11 months ago
Improving cache lifetime reliability at ultra-low voltages
Voltage scaling is one of the most effective mechanisms to reduce microprocessor power consumption. However, the increased severity of manufacturing-induced parameter variations a...
Zeshan Chishti, Alaa R. Alameldeen, Chris Wilkerso...
TDSC
2010
111views more  TDSC 2010»
13 years 2 months ago
Using Underutilized CPU Resources to Enhance Its Reliability
—Soft errors (or Transient faults) are temporary faults that arise in a circuit due to a variety of internal noise and external sources such as cosmic particle hits. Though soft ...
Avi Timor, Avi Mendelson, Yitzhak Birk, Neeraj Sur...
PLDI
2006
ACM
13 years 10 months ago
SAFECode: enforcing alias analysis for weakly typed languages
Static analysis of programs in weakly typed languages such as C and C++ is generally not sound because of possible memory errors due to dangling pointer references, uninitialized ...
Dinakar Dhurjati, Sumant Kowshik, Vikram S. Adve