21 search results - page 1 / 5 » MARS-C: modeling and reduction of soft errors in combination... |
DAC
2006
ACM
14 years 5 months ago
2006
ACM
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we pre...
DATE
2007
IEEE
13 years 10 months ago
2007
IEEE
Due to reduction in device feature size and supply voltage, the sensitivity to radiation induced transient faults (soft errors) of digital systems increases dramatically. Intensiv...
ICCAD
2006
IEEE
14 years 1 months ago
2006
IEEE
Soft errors in logic are emerging as a significant reliability problem for VLSI designs. This paper presents novel circuit optimization techniques to mitigate soft error rates (SE...
ISQED
2007
IEEE
13 years 10 months ago
2007
IEEE
Due to the shrinking of feature size and reduction in supply voltages, nanoscale circuits have become more susceptible to radiation induced transient faults. In this paper, we use...
DSN
2002
IEEE
13 years 9 months ago
2002
IEEE
This paper examines the effect of technology scaling and microarchitectural trends on the rate of soft errors in CMOS memory and logic circuits. We describe and validate an end-to...