21 search results - page 2 / 5 » MARS-C: modeling and reduction of soft errors in combination... |
VLSID
2007
IEEE
14 years 4 months ago
2007
IEEE
Accurate electrical masking modeling represents a significant challenge in soft error rate analysis for combinational logic circuits. In this paper, we use table lookup MOSFET mode...
DATE
2006
IEEE
13 years 10 months ago
2006
IEEE
Soft errors have emerged as an important reliability challenge for nanoscale VLSI designs. In this paper, we present a fast and efficient soft error rate (SER) computation algorit...
ITC
2003
IEEE
13 years 9 months ago
2003
IEEE
In this paper, a new paradigm for designing logic circuits with concurrent error detection (CED) is described. The key idea is to exploit the asymmetric soft error susceptibility ...
VLSID
2006
IEEE
14 years 4 months ago
2006
IEEE
Radiation induced soft errors in combinational logic is expected to become as important as directly induced errors on state elements. Consequently, it has become important to deve...
ISQED
2006
IEEE
13 years 10 months ago
2006
IEEE
This paper is concerned with statically analyzing the susceptibility of arbitrary combinational circuits to single event upsets that are becoming a significant concern for reliabi...