2 search results - page 1 / 1 » MONSOON: SAT-Based ATPG for Path Delay Faults Using Multiple... |
ET
2010
13 years 2 months ago
2010
Abstract As technology scales down into the nanometer era, delay testing of modern chips has become more and more important. Tests for the path delay fault model are widely used to...
ICCAD
1999
IEEE
13 years 8 months ago
1999
IEEE
In this paper we present new methods for fast justification and propagation in the implication graph (IG) which is the core data structure of our SAT based implication engine. As ...