5 search results - page 1 / 1 » March CRF: an Efficient Test for Complex Read Faults in SRAM... |
DDECS
2007
IEEE
13 years 11 months ago
2007
IEEE
: In this paper we study Complex Read Faults in SRAMs, a combination of various malfunctions that affect the read operation in nanoscale memories. All the memory elements involved ...
DATE
2006
IEEE
13 years 11 months ago
2006
IEEE
Static Linked Faults are considered an interesting class of memory faults. Their capability of influencing the behavior of other faults causes the hiding of the fault effect and m...
DATE
1998
IEEE
13 years 9 months ago
1998
IEEE
Most memory test algorithms are optimized tests for a particular memory technology and a particular set of fault models, under the assumption that the memory is bit-oriented; i.e....
DFT
1999
IEEE
13 years 9 months ago
1999
IEEE
In this paper, we present a memory fault simulator called the Random Access Memory Simulator for Error Screening (RAMSES). Although it was designed based on some wellknown memory ...
ISCA
2010
IEEE
13 years 9 months ago
2010
IEEE
Technology advancements have enabled the integration of large on-die embedded DRAM (eDRAM) caches. eDRAM is significantly denser than traditional SRAMs, but must be periodically r...