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» Measurement of Inherent Noise in EDA Tools
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ISQED
2002
IEEE
105views Hardware» more  ISQED 2002»
13 years 9 months ago
Measurement of Inherent Noise in EDA Tools
With advancing semiconductor technology and exponentially growing design complexities, predictability of design tools becomes an important part of a stable top-down design process...
Andrew B. Kahng, Stefanus Mantik
WCE
2007
13 years 6 months ago
The Observation of Output Signal of MSGS
— The strength of Micro Systems Technology (MST) is the ability to fabricate a large number of small devices economically. However such devices tend to have errors caused by the ...
K. Nishiyama, M. C. L. Ward
ENGL
2008
75views more  ENGL 2008»
13 years 4 months ago
The Performance of the Output Signal of Micro Switch Group Sensor (MSGS)
The strength of Micro Systems Technology (MST) is the ability to fabricate a large number of small devices economically. However such devices tend to have errors caused by the vari...
K. Nishiyama, M. C. L. Ward
BMCBI
2006
116views more  BMCBI 2006»
13 years 4 months ago
Integrative missing value estimation for microarray data
Background: Missing value estimation is an important preprocessing step in microarray analysis. Although several methods have been developed to solve this problem, their performan...
Jianjun Hu, Haifeng Li, Michael S. Waterman, Xiang...