6 search results - page 1 / 2 » Memory Testing Under Different Stress Conditions: An Industr... |
DATE
2005
IEEE
13 years 10 months ago
2005
IEEE
ITC
2000
IEEE
13 years 9 months ago
2000
IEEE
This paper describes the results of testing 50 single inline memory modules (SIMMs), each containing 16 16Mbit DRAM chips (DUTs); 39 SIMMs failed, and of the 800 DUTs, 116failed. ...
ICNP
2003
IEEE
13 years 10 months ago
2003
IEEE
Practical crossbar scheduling algorithms for CIOQ switches such as PIM and ¢ -SLIP, can perform poorly under extreme traffic conditions, frequently failing to be workconserving....
TR
2010
12 years 11 months ago
2010
Abstract--In the past ten years, the software aging phenomenon has been systematically researched, and recognized by both academic, and industry communities as an important obstacl...
BIRTHDAY
2010
Springer
13 years 2 months ago
2010
Springer
The event-based paradigm plays an important role to reflect logistics processes in modern IT infrastructures. Events occur at many stages, e.g., when goods tagged with RFID chips a...