4 search results - page 1 / 1 » Metrics for Architecture-Level Lifetime Reliability Analysis |
ISPASS
2008
IEEE
13 years 10 months ago
2008
IEEE
Abstract— This work concerns metrics for evaluating microarchitectural enhancements to improve processor lifetime reliability. A commonly reported reliability metric is mean time...
ASAP
2005
IEEE
13 years 10 months ago
2005
IEEE
This paper explores low-power reliable microarchitectures for addition. Power, speed, and reliability (both defect- and fault-tolerance) are important metrics of system design, sp...
DAC
2007
ACM
14 years 5 months ago
2007
ACM
Negative bias temperature instability (NBTI) in MOSFETs is one of the major reliability challenges in nano-scale technology. This paper presents an efficient technique to characte...
MICRO
2009
IEEE
13 years 11 months ago
2009
IEEE
Despite flash memory’s promise, it suffers from many idiosyncrasies such as limited durability, data integrity problems, and asymmetry in operation granularity. As architects, ...